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Capabilities

Microscopy

EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale—and even atomic—resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific applications.

Capability Detail

For a full listing, refer to the "Capabilities" table that links to detailed information about each of EMSL's microscopy instruments. Brief details about the primary microscopy tools available to EMSL users include:

  1. Continuous Precipitation of Ceria Nanoparticles from a Continuous Flow Micromixer.
  2. Phase Contrast X-ray Imaging Signatures for Security Applications.
  3. Oxidative Dissolution of UO2 in a Simulated Groundwater Containing Synthetic Nanocrystalline Mackinawite.
  4. Identification of Fragile Microscopic Structures during Mineral Transformations in Wet Supercritical CO2.
  5. Forsterite [Mg2SiO4)] Carbonation in Wet Supercritical CO2: An in situ High Pressure X-Ray Diffraction Study.
  1. EMSL’s Chinook provides a new angle for validating pore-scale flow simulations (Go with the flow)
  2. EMSL tools reveal morphology, growth mechanisms of precipitates from scCO2 storage (Rods and rosettes)
  3. Micromodels redefine how bubbles characterize CO2 gas flow (Breaking down the bubbly)
  4. Nanoclusters in steel add strength, stability under irradiated conditions (A steel trap)
  5. In silico, in vivo, in vitro approach opens doors for nanoparticle-based drug discovery (Model health)

Microscopy Capabilities Available at EMSL

Instrument Contact
Electron Microprobe Arey, Bruce
McKinley,James P
Electron Microscope: Dual FIB/SEM (FEI Helios) Arey, Bruce
Electron Microscope: Dual FIB/SEM, Environmental (FEI Quanta) Laskin, Alexander
Lea, Scott
Electron Microscope: Dual FIB/SEM, Environmental for radiological samples (Quanta) Arey, Bruce
Lea, Scott
Electron Microscope: Photoemission (PEEM) Joly, Alan G
Electron Microscope: Transmission, CRYO 2005 Dohnalkova, Alice
Electron Microscope: Transmission, Dynamic - (avail. Jan. 2014) Browning,Nigel D
Evans,James E
Electron Microscope: Transmission, Environmental Kabius,Bernd C
Kovarik,Libor
Electron Microscope: Transmission, Liquid Helium, Cryo (JEOL) - (avail. Mar. 2013) Evans,James E
Electron Microscope: Transmission, Scanning Lea, Scott
Wang,Chongmin
Electron Spectrometer: XPS Imaging Engelhard, Mark
Nandasiri,Manjula I
Mammalian Cell Culture Orr, Galya
Mass Spectrometer: Single Particle (SPLAT II) Zelenyuk-Imre,Alla
Microscope: Fluorescence, Single-Molecule Hu, Dehong
Microscope: Fluorescence, Single-Molecule /Patch Clamp Orr, Galya
Microscope: Fluorescence, Super Resolution Structured Illumination Orr, Galya
Microscope: Helium Ion Jiang, Weilin
Lea, Scott
Shutthanandan,Vaithiyalingam
Microscope: Scanning Probe, AFM Compound Hu, Dehong
Microscope: Scanning Probe, AFM, Bioscope, Radiological Rosso,Kevin M
Microscope: Scanning Probe, AFM, Geochemistry Lea, Scott
Rosso,Kevin M
Microscope: Scanning Probe, Dynamic Force Rosso,Kevin M
Microscope: Scanning Probe, Scattering IR SNOM Craig,Ian M
Lea, Scott
Microscope: Scanning Probe, STM/AFM, Low Temperature, UHV Lyubinetsky, Igor
Microscope: Scanning Probe, STM/AFM, PicoSPM Rosso,Kevin M
Microscope: Scanning Probe, Variable Temperature Lyubinetsky, Igor
Microscope: Scanning Probe, Variable Temperature UHV Dohnalek, Zdenek
NMR Spectrometer: 500-MHz WB Bruker (Imaging) - (Bastiat) Renslow,Ryan S
Spectrometer: Atom Probe Devaraj,Arun
Perea,Daniel E
Spectrometer: Fluorescence, Cryogenic Wang,Zheming
Spectrometer: FTIR - standard Johnson, Tim
Spectrometer: High Spatial Resolution Secondary Ion Mass Spectrometry (NanoSIMS) Mahoney Fahey,Christine M
Zhu,Zihua
Spectrometer: Raman/Epifluorescence, Inverted Confocal Hess, Nancy J.
Spectroscopy: Fluorescence, Time-resolved Wang,Zheming
X-ray Computed Tomography Bowden, Mark
Varga,Tamas
Microscopy Capability Lead: Scott Lea , 509-371-6233