Surface characterization of nanomaterials, nanoparticles review in JVSTA
Invited article part of AVS 60th anniversary issue
EMSL scientists joined with researchers from other institutions to develop an invited review featured in the AVS 60th anniversary Journal of Vacuum Science & Technology A commemorative issue published online Aug. 27.
Titled “Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities,” the review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges.
EMSL contributors include: Don Baer, Mark Engelhard, Grant Johnson, Julia Laskin, Jinfeng Lai, Karl Mueller, Prabhakaran Munusamy, Suntharampillai Thevuthasan, Hongfei Wang and Nancy Washton. Also contributing are: Alison Elder and Brittany Baisch, both with the University of Rochester, Rochester, NY; Ajay Karakoti and Satyanarayana Kuchibhatla, both with Battelle Science and Technology India, Pune, Maharashtra, India; and DaeWon Moon at Daegu Gyeongbuk Institute of Science and Technology, Daeju, Korea.
The article evolved from research programs and research conducted as part of the EMSL User Program, and team members’ interactions with colleagues from around the world. Portions of the research in the article were performed using EMSL resources and were supported by the Department of Energy’s offices of Biological & Environmental Research and Basic Energy Sciences.
The JVSTA Sep/Oct 2013 issue is a collection of invited review articles and perspectives by expert scientists and leaders in disciplines and fields represents by AVS for more than 60 years. A printed special cover edition of the commemorative issue will be available at the AVS 60th International Symposium & Exhibition in Long Beach, Calif.
Released: September 05, 2013