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Characterization of PZT/PLZT Multilayers


EMSL Project ID
1847

Abstract

Thin ferroelctric films have been grown using solution deposition methods. Films of alternating layers of lead - zironcate - titanate and lead - lanthanum - zironcate - titanate have been grown, and the ferroelectric response of the films has been measured. The films are formed using a heat treatment that reaches 700 C, and there is concern that diffusion of the lanthanum at these temperatures may impact the overall properties. It has been found using traditional x ray diffraction that the oritation of the films appears to be controlled by the order of the layers deposited. The ferroelectric hysterisis curves also are dominated by the order of the layers. To fully understand this behavior, we propose to examine both the crystal structure and chemical composition of 6 films of alternating layer structures and with varying heat treatments. This would enable us to determine if the first layer is truly controlling the subsequent film orientaiton, and therefore influencing the materials ferroelectric properties.

Project Details

Project type
Exploratory Research
Start Date
2000-02-22
End Date
2000-12-31
Status
Closed

Team

Principal Investigator

David Bahr
Institution
Washington State University