Nondestructive Surface-Spectroscopy of Oxidized Metallic Gas Samples
EMSL Project ID
19855
Abstract
On-going field investigations of the fate and transport of metallic gases for the U.S. nuclear nonproliferation program require enhanced nondestructive surface spectroscopic analyses to determine the nature of the oxidized particles that are deposited on silicon wafer collectors. Attempts with secondary ion mass spectrometry (SIMS) have not been successful due to the rapid erosion of the particles from the collector surface during the analysis. In an attempt to solve this problem, we are requesting rapid access to two EMSL capabilities with high sensitivity to thin films on surfaces. These are 1) cryogenic laser induced fluorescence, and 2) specular-reflectance Fourier transform infrared spectroscopy. We will provide two nonhazardous nonradioactive specimens consisting of silicon wafers in pristine condition or exposed to the metallic gas under environmental conditions. If these preliminary tests prove successful, we will submit a full proposal for follow-on work.
Project Details
Project type
Limited Scope
Start Date
2007-05-31
End Date
2007-07-19
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members