XPS characterizationof ion-beam induced surface modification
EMSL Project ID
2162
Abstract
Our research is focused on the interaction of an ion beam with self-assembled monolayers (SAMs) of organothiols absorbed on a gold surface. In these experiments low-energy ion beam (1-100 eV) interaction with SAMs results in a variety of procceses: surface-induced dissociation of molecular ion; ion neutralization on the surface (soft landing); surface damage; reactive and non-reactive scattering of the primary ion beam. Accurate surface characterization before and after the exposure to the ion beam is a crucial step in understanding ion-surface interaction, identifying surface modification and designing new experiments to enhance (or avoid) surface modification in a controlled way. Studying soft landing of biomolecules on SAMs is particularly important for both nanotechnology and molecular biology. Another important process - surface-induced dissociation- is a powerful tool for structure elucidation of peptides and proteins using mass spectrometry. Reproducibility of experimental results can be obtained provided the surface is carefully characterized. XPS is one of the methods that can be used for surface characterization. This method will provide us with information on the morphology of the surface as well as its chemical composition.
Project Details
Project type
Exploratory Research
Start Date
2001-07-01
End Date
2004-07-06
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members