Film Characterization of Silicon- and Zirconium-based Sol-Gel Coatings by Scanning Probe Microscopy
EMSL Project ID
2357
Abstract
We are investigating performance and degradation mechanism of two types of hybrid sol-gel pretreatment for aircraft Al at the Air Force Research Lab. The first type of coatings is a Si-based Self-assembled NAnophase Particle sol-gel, SNAP. SNAP is prepared in solution and subsequently cross-linked to form a non-porous film with tenacious adhesion and superior corrosion protection. The second type is a Zr-based sol-gel. Here, film formation relies on conventional condensation reaction in-situ on the substrate which results in a more porous film structure. We are interested in investigating surface topography of nanostructured silicon- and zirconium-based sol-gel coatings. We want to utilize phase modulation AFM in order to distinguish between inorganic and organic clusters in hybrid sol-gel films; study advantages of contact and tapping mode AFM for determination of surface topography of composite films. Both types of hybrid sol-gel films will be provided pre-applied on Si wafers coated with Al at 1 mm thickness. Instrument Needs: Scanning Probe Microscope; tapping, contact, and phase modulation modes; electrochemical AFM. Dr. Michael Donley (of AFRL) has been investigating these sol-gel films using the TOF-SIMS technique, as part of the ongoing joint effort with EMSL.
Project Details
Project type
Exploratory Research
Start Date
2001-12-01
End Date
2002-12-03
Status
Closed
Released Data Link
Team
Principal Investigator