Study of interfacial phenomena of novel-layered thin film structure
EMSL Project ID
24809
Abstract
The objective of this research is to systematically study novel-layered thin film structures, which include nano-magnetic material thin film and dielectric thin film. The interfacial chemistry and microstructure between magnetic layer and dielectric layer will be also studied. In particular, nano-sized FeAlN thin films, BaTiO3 thin films and the multilayer structure of FeAlN/ BaTiO3 will be provided by Alfred University to Pacific Northwest National Laboratory (PNNL) for the study. At PNNL, the studies will involve utilizations of Rutherford Backscattering
Spectroscopy (RBS).
Project Details
Project type
Large-Scale EMSL Research
Start Date
2007-05-31
End Date
2008-06-01
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members