Characterization of Sn Whiskers
EMSL Project ID
2490
Abstract
Sn whiskers have for long been known as a failure mechanism in electronic components. This study seeks to determine the origin of Sn whiskers and their growth mechanism. In this collaboration with PNNL we propose to characterize whiskers using FEG-SEM, a technique not available to us at WSU.
Project Details
Project type
Exploratory Research
Start Date
2002-04-01
End Date
2003-04-22
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members