Structural analysis of ion-beam-induced amorphous SiC by advanced electron microscopy
EMSL Project ID
25420
Abstract
Silicon carbide (SiC) and its composites have been proposed for structural components in future nuclear fusion reactors, because of their high temperature strength, pseudo-ductile fracture behavior, and low-induced radioactivity. However, long-term operation under radiation environments leads to degradation of the material, and ultimately induces amorphization which is often accompanied with significant volume changes and concomitant microcracking. Atomistic information regarding amorphous structures of SiC is therefore of technological importance to clarify radiation effects on this material, and much effort has been devoted to clarify short-range order in amorphous SiC.
Project Details
Project type
Large-Scale EMSL Research
Start Date
2007-05-31
End Date
2008-06-01
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members
Related Publications
Journal of Applied Physics
Journal of Applied Physics (in press)