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Structural analysis of ion-beam-induced amorphous SiC by advanced electron microscopy


EMSL Project ID
25420

Abstract

Silicon carbide (SiC) and its composites have been proposed for structural components in future nuclear fusion reactors, because of their high temperature strength, pseudo-ductile fracture behavior, and low-induced radioactivity. However, long-term operation under radiation environments leads to degradation of the material, and ultimately induces amorphization which is often accompanied with significant volume changes and concomitant microcracking. Atomistic information regarding amorphous structures of SiC is therefore of technological importance to clarify radiation effects on this material, and much effort has been devoted to clarify short-range order in amorphous SiC.

Project Details

Project type
Large-Scale EMSL Research
Start Date
2007-05-31
End Date
2008-06-01
Status
Closed

Team

Principal Investigator

Manabu Ishimaru
Institution
Osaka University

Team Members

Yoshihiko Hirotsu
Institution
Osaka University

Muneyuki Naito
Institution
Osaka University

Akihiko Hirata
Institution
Osaka University

Related Publications

Journal of Applied Physics
Journal of Applied Physics (in press)