SEM and SIMS analysis of organic semiconductor films
grown using liquid crystal solvents
EMSL Project ID
3371
Abstract
We propose to use EMSL facilities to perform scanning electron microscopy (SEM) and secondary ion mass spectrometry (SIMS) analysis of approximately 10 ? 20 samples consisting of thin films of the organic semiconductor tetracene on silicon wafer substrates. Depending on the results of these analyses we also propose at this or a future time to further analyze these samples with grazing incidence fourier-transform infrared spectroscopy (GA-FTIR) and x-ray diffraction (XRD). The primary objectives are to characterize the micron- to nanometer-scale structural order of these films as well as their chemical composition. A secondary objective is to determine the films? crystallographic orientation, in those that are found to be crystalline. A student will travel to EMSL and stay there for the duration of the analysis, which we estimate will take 2 ? 3 days. Assistance from EMSL staff in analyzing the samples and interpreting the results is also requested.
Project Details
Project type
Exploratory Research
Start Date
2003-02-21
End Date
2004-02-24
Status
Closed
Released Data Link
Team
Principal Investigator