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Characterization of heat treated Silicon Carbide specimens using Scaning Electron Microscopy.


EMSL Project ID
3374

Abstract

A number of SiC solid specimens (about 15mm square in size and 2mm thick) have been heat treated
at temperatures of 1000 degrees Celcius for a duration of one hour and let to cool down to room temperature, this
cycle being repeated several times, in order to determine the possible effects of thermal cycling on the microstructure
of the SiC material. The differences in microstructure, if any, will be assessed using high resolution Scaning Electron
Microscopy. We wish to determine the effect of repeated thermal cycling on the microstructure of this material and also determine
if an oxide layer forms, and its composition, when the specimens are annealed in air compared to annealed in argon atmosphere.

Project Details

Project type
Exploratory Research
Start Date
2003-05-01
End Date
2006-04-13
Status
Closed

Team

Principal Investigator

Maxime Guinel
Institution
Washington State University

Team Members

M. Norton
Institution
Washington State University