Analysis of Spent Free Electron Laser Photocathodes
EMSL Project ID
40990
Abstract
This project will use existing capabilities to characterize expired photocathode materials. We will conduct post-mortem investigations of used (expired) photocathodes from JLab to determine photocathode degradation mechanisms under operating FEL conditions. Initial interrogation will use time-of-flight secondary ion mass spectrometry (TOF-SIMS) and Rutherford backscattering spectrometery (RBS) to understand the elemental depth profiles. Subsequent post-mortem analysis may include EMSL equipment such as atom probe tomography (ATM) to determine the spatial distribution of the elements.
Project Details
Project type
Limited Scope
Start Date
2010-06-29
End Date
2010-08-29
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members
Related Publications
Shutthanandan V, Z Zhu, ML Stutzman, F Hannon, C Hernandez-Garcia, MI Nandasiri, SVNT Kuchibhatla, S Thevuthasan, and WP Hess. 2012. "Surface Science Analysis of GaAs Photocathodes Following Sustained Electron Beam Delivery." Physical Review Special Topics - Accelerators and Beams 15(6):063501. doi:10.1103/PhysRevSTAB.15.063501