Exploring the Radiation Damage Resistance of Nanoscale Interfaces
EMSL Project ID
46001
Abstract
The objective of this research is to rigorously test the hypothesis that internal interfaces can be manipulated at the nanoscale to enhance recombination of radiation-produced defects to dramatically reduce radiation damage without compromising other physical and mechanical properties. This hypothesis has never been rigorously tested and there has never been a fundamental study of radiation damage at interfaces that encompasses the wide range of interface types and structures proposed here. In this project we seek to 1) understand defect absorption at interfaces as a function of interface character and properties, 2) determine interface ability to adsorb and delocalize defects to promote recombination, and 3) determine interface stability and evolution under irradiation, including the saturation limit for defect absorption. This proposal is aligned with two of the principal focus areas within the Materials Sciences and Engineering Division of BES; including exploration of approaches to improve materials performance through interfacial design, and investigation of radiation effects on the mechanical and physical behavior of materials. The work consists of integrated experiments and modeling of a wide range of interface types to determine how variation in interface properties can affect defect absorption and recombination. Precisely tailored interfaces as well as nanostructured polycrystalline thin films will be studied in order to explore the full range of interface types relevant to the materials found in advanced nuclear energy systems. Reaching these objectives will demonstrate the stated hypothesis by determining interface stability under irradiation and will enable design of higher performance nuclear energy systems with attendant economic, safety and environmental benefits.
Project Details
Project type
Exploratory Research
Start Date
2011-12-27
End Date
2013-02-12
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members
Related Publications
Kaspar TC, ME Bowden, CM Wang, V Shutthanandan, S Manandhar, RM Van Ginhoven, BD Wirth, and RJ Kurtz. 2013. "Defect Structure of Spitaxial CrV Thin Films on MgO(001)." Thin Solid Films 550:1-9. doi:10.1016/j.tsf.2013.09.067