Characterization of ion movement in organic electronic devices via ToF-SIMS
EMSL Project ID
47393
Abstract
An emerging advantage of organic semiconductors is their ability to conduct ions in applications such as light-emitting electrochemical cells, photovoltaic devices, actuators, and electrochromic devices, among others. This ability of organic materials to conduct both ionic and electronic currents in the solid state sets these materials apart from their inorganic counterparts, potentially enabling disruptive technologies not modeled after existing semiconductor devices, yet these benefits are under-utilized, in part because the fundamental electrochemical processes in these materials are not well characterized. In particular, evidence suggests that the profiles of ions and electrochemical doping in the polymer film during operation significantly impacts the performance and stability of the device. However, ion transport and electrochemical doping in conjugated polymer films are not well understood. The primary objective of this proposal is to build a comprehensive picture of ion migration and ion profiles in polymer-based devices. This will be achieved by directly profiling ion distributions in both dynamic and fixed-junction LEC devices following application of voltage, using ToF-SIMS. These measurements will provide a detailed map of ions in the polymer film, and allow us to correlate this information with changes in device performance. These techniques will therefore provide crucial information relevant to a wide range of emerging technologies based on electrochemically active, or iontronic devices. Currently, Western Washington University does not have SIMS capabilities. Access to the facilities at EMSL will therefore be critical in carrying out the proposed research.
Project Details
Project type
Exploratory Research
Start Date
2012-06-18
End Date
2013-06-30
Status
Closed
Released Data Link
Team
Principal Investigator
Related Publications
Shoji TD, Z Zhu, and JM Leger. 2013. "Characterizing Ion Profiles in Dynamic Junction Light-Emitting Electrochemical Cells." ACS Applied Materials & Interfaces 5(22):11509-11514. doi:10.1021/am403805j
Shoji, T., Zhu, Z., Ilkevich, A., and J. Leger. Characterization of ion movement in light-emitting electrochemical cells via ToF-SIMS. Poster, Materials Research Society Spring 2013 Meeting & Exhibit. April 4th, 2013. San Francisco, California.
Shoji, T.; Zhu, Z.; Ilkevich, A.; and J. Leger. Characterization of ion movement in light-emitting electrochemical cells via ToF-SIMS. Presentation, American Physical Society March Meeting 2013. March 18, 2013. Baltimore, Maryland.