STM Tip Analysis by TEM
EMSL Project ID
5121
Abstract
This is a proof of principle study. The goal is to determine whether the TEM instrumentation can be used to analyze the sharpness and oxidation of the tips used in scanning tunneling microscopy (STM). The tungsten tips are prepared ex situ using the electrochemical etching procedure in KOH solvent. The size of the tip apex dramatically depends on the precise etching conditions. Using TEM will allow us to determine the importance of various etching parameters (e.g. etching current, voltage), optimize the etching conditions, and prepare the extremely sharp, high quality STM tips.Project Details
Project type
Exploratory Research
Start Date
2003-10-15
End Date
2005-10-31
Status
Closed
Released Data Link
Team
Principal Investigator