Structural characterization of Nanoporous Thin Films

The adsorptive/reactive properties of nanoporous thin films of metals and oxides grown via ballistic deposition technique are being studied in our laboratory. We propose to utilize a variety of ex-situ techniques currently available in EMSL such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM) to characterize the thin film morphology and X-ray diffraction (XRD) to determine film crystallinity and orientation.