Test Measurements and Approaches for Enhancing Information Available from Surface Analysis of Oxides, nanoparticles and organic materials analysis
EMSL Project ID
8221a
Abstract
This activity involves extending the state of the art in surface analysis by expanding the understanding of equipment capability, testing new approaches to instrument calibration, operation and data analysis, and understanding the limitations of measurement methods. Although EMSL contains a uniquely comprehensive set of surface analysis capabilities it is the combination of instrument available and state of the art operation (and analysis) skills that enable EMSL to push boundaries of analysis and to expand the range of information available. This proposal is to continue team efforts that involve EMSL users and EMSL staff working to identify important analysis limitations and challenges and then develop information or approaches that enhance instrumental capability to meet the challenges. Areas that have been examined to date include extracting information and controlling charging during AES and XPS measurements and determination of damage factors for a variety of materials and establishment of a damage index. These activities have led to publications and contribute to the development of surface analysis guides through ISO TC201 Committee on Surface Chemical Analysis and ASTM E42 Committee on Surface Analysis. In addition to keeping EMSL at the state of the art in surface analysis these activities have international visibility.
Project Details
Project type
Large-Scale EMSL Research
Start Date
2007-05-31
End Date
2008-06-01
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members
Related Publications
Baer DR. 2011. "Summary of ISO/TC 201 Standard: ISO 29081: 2010, Surface Chemical Analysis - Auger Electron Spectroscopy - Reporting of Methods Used for Charge Control and Charge Correction." Surface and Interface Analysis 43(11):1444-1447. doi:10.1002/sia.3724
Baer D.R. 2018. "The Chameleon Effect: characterization challenges due to the variability of nanoparticles and their surfaces." Frontiers in Chemistry 6. PNNL-SA-131780. doi:10.3389/fchem.2018.00145
Baer D.R., and A.G. Shard. 2020. "Role of consistent terminology in XPS reproducibility." Journal of Vacuum Science and Technology A--Vacuum, Surfaces and Films 38, no. 3:031203. PNNL-SA-150698. doi:10.1116/6.0000016
Baer DR, and MH Engelhard. 2010. "XPS Analysis of Nanostructured Materials and Biological Surfaces." Journal of Electron Spectroscopy and Related Phenomena 178-179:415-432. doi:10.1016/j.elspec.2009.09.003
Baer DR, AS Lea, J Geller, JS Hammond, L Kover, CJ Powell, MP Seah, M Suzuki, JW Watts, and J Wolstenholme. 2010. "Approaches to analyzing insulators with Auger Electron Spectroscopy: Update and Overview." Journal of Electron Spectroscopy and Related Phenomena 176(1-3, SP ISS):80-94.
Baer DR, DJ Gaspar, P Nachimuthu, SD Techane, and DG Castner. 2010. "Application of Surface Chemical Analysis Tools for Characterization of Nanoparticles." Analytical and Bioanalytical Chemistry 396(3):983-1002. doi: 10.1007/s00216-009-3360-1
Improving surface-analysis methods for characterization of advanced materials by development of standards, reference data, and interlaboratory comparisons†
Summary of ISO/TC 201 standard: XVIII, ISO 19318:2004—surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
Summary: Update to ASTM guide E 1523 to charge control and charge referencing techniques in x-ray photoelectron spectroscopy
Techane SD, DR Baer, and DG Castner. 2011. "Simulation and Modeling of Self-Assembled Monolayers of Carboxylic Acid Thiols on Flat and Nanoparticle Gold Surfaces." Analytical Chemistry 83(17):6704-6712. doi:10.1021/ac201175a