XRD Analysis of Indium Tin Oxide Thin Films
EMSL Project ID
1621
Abstract
An XRD study of indium tin oxide (ITO) thin films for chemical sensing and organic light emitting diode applications will be undertaken in order to determine any structural differences present between 1) ITO obtained from a commercial source and ITO deposited in our laboratory and 2) ITO deposited on a quartz substrate and ITO incorporated into an electroactive integrated optical waveguide structure.
Project Details
Project type
Exploratory Research
Start Date
1999-06-15
End Date
1999-09-01
Status
Closed
Released Data Link
Team
Principal Investigator