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XRD Analysis of Indium Tin Oxide Thin Films


EMSL Project ID
1621

Abstract

An XRD study of indium tin oxide (ITO) thin films for chemical sensing and organic light emitting diode applications will be undertaken in order to determine any structural differences present between 1) ITO obtained from a commercial source and ITO deposited in our laboratory and 2) ITO deposited on a quartz substrate and ITO incorporated into an electroactive integrated optical waveguide structure.

Project Details

Project type
Exploratory Research
Start Date
1999-06-15
End Date
1999-09-01
Status
Closed

Team

Principal Investigator

Darren Dunphy
Institution
University of Arizona