Skip to main content

Electron Microscopy and XPS analysis of Porous Silicon


EMSL Project ID
1942

Abstract

The proposed research is designed to generate SEM and XPS data on porous silicon surfaces. The purpose is to correlate desorption/ionization on porous silicon (DIOS) mass spectrometry signals (Nature 1999, 399, 243) with porous silicon surface morphology.

Project Details

Project type
Exploratory Research
Start Date
2000-05-10
End Date
2001-01-01
Status
Closed

Team

Principal Investigator

Gary Siuzdak
Institution
The Scripps Research Institute