Electron Microscopy and XPS analysis of Porous Silicon
EMSL Project ID
1942
Abstract
The proposed research is designed to generate SEM and XPS data on porous silicon surfaces. The purpose is to correlate desorption/ionization on porous silicon (DIOS) mass spectrometry signals (Nature 1999, 399, 243) with porous silicon surface morphology.
Project Details
Project type
Exploratory Research
Start Date
2000-05-10
End Date
2001-01-01
Status
Closed
Released Data Link
Team
Principal Investigator