XPS Studies of Nickel Cobalt Oxide Films
EMSL Project ID
2112
Abstract
XPS will be used to determine composition of nickel cobalt oxide films fabricated by both solution deposition and sputtering. Information on redox states and stoichiometries, in addition to depth profiling, will be used to support film development work being conducted in support of DARPA project Electroactive Coatings and Shutters for Protection of Sensors. DARPA program is managed by GJ Exarhos, PNNL.
Project Details
Project type
Exploratory Research
Start Date
2000-11-30
End Date
2003-11-30
Status
Closed
Released Data Link
Team
Principal Investigator