XPS Studies of Nickel Cobalt Oxide Films
EMSL Project ID
2112
Abstract
XPS will be used to determine composition of nickel cobalt oxide films fabricated by both solution deposition and sputtering. Information on redox states and stoichiometries, in addition to depth profiling, will be used to support film development work being conducted in support of DARPA project Electroactive Coatings and Shutters for Protection of Sensors. DARPA program is managed by GJ Exarhos, PNNL.
Project Details
Project type
Exploratory Research
Start Date
2000-11-30
End Date
2003-11-30
Status
Closed
Released Data Link
Team
Principal Investigator
Related Publications
Conducting spinel oxide films with infrared transparency
Influence of temperature and electronic disorder on the Raman spectra of nickel cobalt oxides
Owings RR, GJ Exarhos, CF Windisch, PH Holloway, and JG Wen. 2005. "Process Enhanced Polaron Conductivity of Infrared Transparent Nickel-Cobalt Oxide." Thin Solid Films 483(1-2):175-184.
Vibrational spectroscopic study of the site occupancy distribution of cations in nickel cobalt oxides