Characterization of Covalently Bound Monolayer Via XPS
EMSL Project ID
2252
Abstract
Recently, we developed a novel technique for the covalent immobilization of polymer thin films on solid substrates using functionalized perfluorophenylazides (PFPAs). Functionalization of the PFPA allows for surface derivitization of the solid substrate anchoring the perfluorophenylazido groups. Spin coating of a polymer film followed by UV irradiation triggers the attachment of polymer chains to the substrate surface, via the C-H and/or N-H insertion reaction of the highly reactive perfluorophenyl nitrene. The result is a thin polymer film covalently attached to the substrate surface. In order to validate our results, characterization of the functionalized wafer surface is necessary. I would like to utilize the Xray Photoelectron Spectroscopy (XPS) technology available at PNNL to determine the density of the PFPA monolayer on the solid substrate (silicon wafer).
Project Details
Project type
Exploratory Research
Start Date
2001-04-26
End Date
2001-05-31
Status
Closed
Released Data Link
Team
Principal Investigator