Carbon Nanotube Tips for High Aspect Ratio Scanning Tunneling Microscopy
EMSL Project ID
23490
Abstract
We propose to characterize carbon nanotube (CNT) tips supported on metal wires (W, Pt Ir) for scanning tunneling microscopy (STM) using an existing Omicron UHV STM at EMSL. A series of experiments will be performed on standard calibration samples (110 TiO2 single crystal and highly oriented pyrolytic graphite) with CNT tips supplied by the Stevenson research group at UT-Austin to assess the electrical conductivity and topographic resolution of CNT tips. High resolution, possibly atomically resolved images of the calibration samples will allow us to compare imaging parameters relative to conventional STM tips. Robust, higher aspect ratio tips with small tip radius are needed to obtain better spatial resolution and current sensitivity when characterizing various materials with pronounced roughness or deep trenches or vias. Rapid access is requested since this study complements another currently on going at UT-Austin that has reached the publication stage. The complementary STM data will demonstrate a broader impact in the development of carbon nanotube tips for scanning probe microscopy.
Project Details
Project type
Limited Scope
Start Date
2006-12-05
End Date
2007-01-10
Status
Closed
Released Data Link
Team
Principal Investigator