Site-Specific Sample Preparation of Surfaces and Buried Interfaces
for TEM and Atom Probe Analysis
EMSL Project ID
26691
Abstract
Technique development of methods for preparing cross-sectional TEM samples and atom-probe needle samples with the new dual-beam FIB instrument is proposed. Prior experience in FIB sample preparation with earlier-generation instruments offsite has demonstrate the need to develop sophisticated methods and strong user proficiency to effectively use the FIB. The work would involve several scientist /engineers at PNNL as well as Bruce Arey from the EMSL. The work is expected to yield suitable specimens from environmentally degraded alloys, and to lead to more demanding applications including 3-dimensional reconstruction of defective materials from FIB-cut samples.
Project Details
Project type
Capability Research
Start Date
2007-09-01
End Date
2009-09-06
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members