Quantitative Characterization of Surface Plasmon-Enhanced Electromagnetic Fields on Ag Nanostructures by Two-photon Photoemission Electron Microscopy
EMSL Project ID
40065
Abstract
Achieving a precise correlation between the localized optical properties and the local geometry of nanostructures will significantly advance the understanding of the nature and origin of nano-localized optical fields (hot spots), and allow for the design and fabrication of novel electronic and photonic devices. We propose to use two-photon photoemission electron microscopy (2P-PEEM) to investigate the hot spots on Ag nanostructures and their assemblies. 2P-PEEM will allow for quantitative measurement of enhanced electromagnetic (EM) fields associated with the localized surface plasmon resonance (SPR) excitation on specific individual hot spot. Additionally, 2P-PEEM will allow us to quantitatively investigate the local extinction profile, polarization dependence, and ultra-fast excited state dynamics of the hot spots on the nanometer scale.
Project Details
Project type
Large-Scale EMSL Research
Start Date
2010-10-01
End Date
2013-09-30
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members
Related Publications
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