In-Situ/Liquid Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Environmental Interfaces
EMSL Project ID
42330
Abstract
This is a continuation of EMSL project number 36601. A versatile and self-contained interface for high-vapor pressure liquid surfaces, including aqueous interfaces has been built that permits the exploration of the surfaces of these liquids with several vacuum-based analytical instruments. It uses microfluidics to flow the liquid under study past a 3-micron diameter window. This window supports the liquid against the vacuum by the liquids surface tension, while keeping the high-density region traversed by the probe beams to only a few microns. This also limits temperature and concentration changes due to evaporation of the solvent. The beam damage caused by the probe beams is largely negligible, as the flowing liquid surface self-renews. We will in this year extend the method, apply it to new systems and instruments, and publish results.
Project Details
Project type
Exploratory Research
Start Date
2010-12-02
End Date
2011-12-04
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members