Understanding Thermal Aluminum Grain Deposition using the Helium Ion Microscopy
EMSL Project ID
48509
Abstract
Collaboration work with Sandia National Laboratory using the Helium Ion Microscopy. Group from Sandia will visit EMSL in May and June to explore the capabilities that the Helium Ion scope (HeIM) can provide such as imaging non-conductive materials such as oxide materials. During the visit will demonstrate imaging capabilities like secondary electron imaging, multi channel ion imaging and using the flood gun for non-conductive samples. Also will demonstrate the lithography capabilities that we have on the Orion Helium Ion scope. The visits are proof of principal that the HeIM is a microscope that can be used in collaborations with other techniques. EMSL is one few labs in the US that can provide this microscopy capabilities.
Project Details
Start Date
2014-05-09
End Date
2014-09-30
Status
Closed
Released Data Link
Team
Principal Investigator