Compositional and structural analysis of environmentally sensitive materials at the atomic scale by correlative APT and TEM studies
EMSL Project ID
51289
Abstract
The proposed work will aid in the development of a protocol that enables the preparation, handling, and transfer of samples under controlled environmental conditions for correlative analyses with focused ion beam (FIB), scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM), and atom probe tomography (APT) tools. This then will enable correlative near-atomic to nanoscale structural and chemical analyses of environmentally sensitive materials, including cryogenic specimens and benefit the scientific community by the improved the quality of specimens for correlative analyses. Partnership with EMSL is crucial because it houses the required APT, TEM, and Ar ion milling systems and EMSL’s environmental transfer hub (ETH) which is a unique APT specimen transfer system use to prevent ambient exposure of environmentally sensitive samples prior to APT and TEM characterization. We will employ APT and TEM techniques, as well as argon ion milling to develop a new methodology for atomic-scale compositional and structural analysis of environmentally sensitive materials. It is expected that the work will demonstrate that concentrated beam, low-energy argon ion milling can be an important post-FIB specimen preparation step for APT and related surface science applications.
Project Details
Project type
Scientific Partner
Start Date
2020-04-10
End Date
2022-07-31
Status
Closed
Released Data Link
Team
Principal Investigator
Co-Investigator(s)