X-ray and TEM Characterization of Magnetic Thin Films
EMSL Project ID
6501
Abstract
Electrochemical deposition is very efficient method for deposition of thin (and thick) metallic films. The objectives for film production can be various but if the films are magnetic the most suitable use of such films is for memory storage devices. Characterization of thin film properties is essential toward their application for electronic devices, or any other applications. X-ray and TEM characterization provide essential information toward the thin film properties (crystallization, film thickness, orientation, nanometer dimension measurements, etc.) University of Idaho has no research capability for x-ray and TEM characterization of thin films.
Project Details
Project type
Exploratory Research
Start Date
2004-01-08
End Date
2005-01-13
Status
Closed
Released Data Link
Team
Principal Investigator