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X-ray and TEM Characterization of Magnetic Thin Films


EMSL Project ID
6501

Abstract

Electrochemical deposition is very efficient method for deposition of thin (and thick) metallic films. The objectives for film production can be various but if the films are magnetic the most suitable use of such films is for memory storage devices. Characterization of thin film properties is essential toward their application for electronic devices, or any other applications. X-ray and TEM characterization provide essential information toward the thin film properties (crystallization, film thickness, orientation, nanometer dimension measurements, etc.) University of Idaho has no research capability for x-ray and TEM characterization of thin films.

Project Details

Project type
Exploratory Research
Start Date
2004-01-08
End Date
2005-01-13
Status
Closed

Team

Principal Investigator

Batric Pesic
Institution
University of Idaho