Surface Assessment of BxCy Thin Film on Si
EMSL Project ID
9992
Abstract
Two diode devices obtained from the University of Nebraska, Lincoln, will be studied with respect to surface morphology, stoichiometry and think layer thickness via scanning electron microscopy.
Project Details
Project type
Exploratory Research
Start Date
2004-06-25
End Date
2006-07-07
Status
Closed
Released Data Link
Team
Principal Investigator