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Surface Assessment of BxCy Thin Film on Si


EMSL Project ID
9992

Abstract

Two diode devices obtained from the University of Nebraska, Lincoln, will be studied with respect to surface morphology, stoichiometry and think layer thickness via scanning electron microscopy.

Project Details

Project type
Exploratory Research
Start Date
2004-06-25
End Date
2006-07-07
Status
Closed

Team

Principal Investigator

April Carman
Institution
Pacific Northwest National Laboratory