Shriram Ramanathan

Harvard University

Projects

High-resolution Ion Scattering Studies of nano-scale oxide films and thermal stability of oxide-semiconductor interfaces

Lead Institution

Harvard University

Principal Investigator

Shriram Ramanathan

Project type

Exploratory Research

High-dielectric constant oxides are presently being investigated for potential applications in future nano-electronic devices. Stability of high-dielectric constant oxide films on semiconductor…

High-resolution interfacial studies of nano-scale oxide films

Lead Institution

Harvard University

Principal Investigator

Shriram Ramanathan

Project type

Large-Scale EMSL Research

Thin film transition metal-oxides are of great interest to a number of areas ranging from nano-electronic devices to alternate energy technologies. We propose to use the unique ion beam facilities at…

Influencing passivity breakdown resistance of ultra-thin oxides on Al-Ni-Cu alloy surfaces through photo-excitation

Lead Institution

Harvard University

Principal Investigator

Shriram Ramanathan

Project type

Limited Scope

We will investigate the nano-scale passive oxide formation on the effects of Ni addition to Al-Cu alloy thin films against the corrosive environments by XPS, RBS, and NRA facilities. This is a very…