Study of Pattern Formation on the Surface of NiO films
EMSL Project ID
1954
Abstract
Understanding of the surface structure and morphology of NiO surfaces is becoming increasingly important because of their use in spin-valve geometry of GMR sensors. Thick NiO films (500 Å) have been grown on 1 Si wafer. The surface of NiO has developed stripe pattern visible under the optical microscope. The structures observed are of 1-5 micron in size. It is proposed to investigate the nature and the cause of these patterns. In particular we propose to investigate whether the pattern observed with optical microscope is due to topological modulations due to film strain or is it consequence of modification of the surface of the NiO films. If later, it will be of interest to more precisely determine the nature of the stripe regions whether being due to formation of difference surface Ni-compounds or due to adsorbed add-layers. We propose to use a combination of spectroscopic and imaging probe to achieve this task. Scanning Auger Electron Microscopy/Spectroscopy maybe best approach although SEM with EELS capabilities with sufficient resolution maybe also be useful.
Project Details
Project type
Exploratory Research
Start Date
2000-04-06
End Date
2000-09-30
Status
Closed
Released Data Link
Team
Principal Investigator
Team Members