Deposition and characterization of thin films for polarized UV light emission
EMSL Project ID
2097
Abstract
Deposit Mn doped ZnO epitaxial films by CVD in quantum well type structures for polarized UV light emission. Characterization would include XPS, XRD, SEM, SIMS, TEM, RBS, and other surface and thin film analyses.
Project Details
Project type
Exploratory Research
Start Date
2000-11-07
End Date
2002-03-31
Status
Closed
Released Data Link
Team
Principal Investigator