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William Stickle

Institution
Hewlett-Packard Company

Projects

Characterization of oxide based diodes

Lead Institution
Oregon State University
Principal Investigator
Gregory Herman
Project type
Exploratory Research
Recently the field of transparent optoelectronic devices has seen tremendous advances due in part to new materials developments, processing capabilities, and novel applications. Transparent thin…

Characterization of amorphous oxide transparent semiconductors

Lead Institution
Oregon State University
Principal Investigator
Gregory Herman
Project type
Large-Scale EMSL Research
Recently the field of transparent optoelectronic devices has seen tremendous advances due in part to new inorganic materials developments, processing capabilities, and novel applications. …

Characterization of Nb Films

Lead Institution
Hewlett-Packard Company
Principal Investigator
Douglas Ohlberg
3-D chemical imaging of HP supplied Nb oxide and Nb nitride thin films. These films will be prepared using the EMSL FEI Helios Nanolab dual-beam focused ion beam/scanning electron microscopy (FIB/SEM…