Investigation of Analytical Methods for Trace Analysis of Fluoride Glass
EMSL Project ID
1906
Abstract
EMSL has several analytical instruments that could be helpful to us in our effort to improve quantification of trace elements such as Fe, Cu, Ni, and Cr (as well as others) in glass samples. To begin with, we propose to test Secondary Ion Mass Spectrometry (SIMS) as an analytical methodology for the glass standards. SIMS is widely used for analysis of trace elements in solids, especially semiconductors and thin films. Other laser ablation mass spectrometry techniques available at EMSL could also be very valuable. In RLA-TOFMS, the laser wavelength is tuned to a resonant transition for the element of interest, such as iron. Although this contributes to a simpler mass spectrum and can provide high sensitivity, coupling laser power efficiently into the glass surface can be problematic. Laser ablation-inductively coupled plasma-mass spectrometry is a non-resonant laser technique that has been used for quantitative analysis of glasses. The efficiency of plasma ionization may be high compared to RLA-TOFMS, leading to less spot-to-spot variability and more reproducibility. Laser desorption-ion trap mass spectrometry is another technique that may be useful in light of the fact that LANL has this type of instrumentation available. This work at EMSL could guide us in a new direction. This research directly complements current interests at EMSL in laser ablation of solids, research mass spectrometry, and trace analysis. The proposed work also significantly overlaps other PNL projects in laser ablation of waste glasses. We expect that joint peer-reviewed papers will arise out of this collaboration between LANL and EMSL as well as future joint funding opportunities.
Project Details
Project type
Exploratory Research
Start Date
2000-02-15
End Date
2000-06-01
Status
Closed
Released Data Link
Team
Principal Investigator