Electron field emission properties of carbon nanotubes
EMSL Project ID
2278
Abstract
Objectives: Characterize a single isolated carbon nanotube emitter for application to electron beam instruments, such as TEM, SEM and ebeam lithography systems. Approach: In one location, , create nanotubes using various process methods, characterize the structure of the tubes using SEM, TEM and Field emission microscopy and measure the characteristics of a single nanotube (angular intensity distributions, I-V plots, emission noise spectra) for use in an electron optical probe forming or image forming fine focus, low beam current system. This is rather unusual, since most studies of nanotubes come either from groups very familiar with fabrication techniques, other groups familiar with analytical microscopy techniques, and yet other groups familiar with electron optical requirements of cathodes, but none to date seem to come from a single location where all three capabilities are present. Specific Instrument Performance Needs: We are in the process of assembling a Field Emission microscope to study the emission patterns from the nanotubes that we are making. This microscope also should have capabilities to measure apertured current from various areas of the field emission pattern, measure emission noise from these areas and measure I-V data (angular intensity plots). In addition we plan to add capability to leak in various gases, thermally desorb adsorbates on the surface of the nanotubes and monitor the desorption and residual gas mass spectra. Short term needs: In assembling this FE microscope, we need to make use of the capabilities in Paul Burrows lab for ITO deposition and possibly other techniques. As we progress with this work, we expect to find further points of collaboration, especially regarding the analytical equipment at pnl.
Project Details
Project type
Exploratory Research
Start Date
2001-08-01
End Date
2001-08-01
Status
Closed
Released Data Link
Team
Principal Investigator