Surface Analysis of Polyurethanes
EMSL Project ID
2524
Abstract
This is continuing study of the surface domains of segmented polyurethane materials. The surface chemical structure, morphology, and mechanical response of these materials is being investigated using various characterization techniques. X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) are used to map the changes in the surface chemistry of segmented polyurethanes due to chemical exposure and abrasive use. Atomic force microscopy (AFM) and other scanning probe microscopy (SPM) techniques are used to further characterize the surface of known polyurethane bulk samples after chemical exposure. These techniques allow for correlation of morphological and mechanical response changes with surface chemistry changes found using XPS and SSIMS. Results of this investigation will contribute to a better understanding of the degradation of these materials during use. Instrument needs from EMSL include TOF-SIMS in order to achieve the required mass resolution to properly identify the secondary ionic species.
Project Details
Project type
Exploratory Research
Start Date
2002-05-06
End Date
2002-11-11
Status
Closed
Released Data Link
Team
Principal Investigator