Development of Ion-Bombardment Surface Treatments for Suppression of Secondary Electron Emission in Accelerator Vacuum Chambers and Other Structures
EMSL Project ID
44715
Abstract
Particle accelerators have become an increasingly essential tool for basic and applied research. Charged particle beams in accelerators can be adversely affected by the build-up of clouds of electrons inside the accelerator vacuum chamber. One source of electrons which can contribute to the growth of the cloud is secondary emission from the walls of the vacuum chamber. The use of surface texturing or grooves on the micron/nanometer scale can reduce the probability of secondary emission from the walls. In the proposed work, we will employ high and low energy ion beams, along with focused ion beam patterning, to generate micron/nanometer scale features on materials. We will attempt to optimize the feature characteristics for minimal secondary emission properties through the development of a fundamental understanding of the secondary electron transport and the ion-solid interactions which produce the surface features. If successful, the tools and techniques developed in this work can be used on a larger scale in future particle accelerators, allowing for higher intensity beams and improved beam quality, which will benefit both basic and applied scientific research that requires particle beams.
Project Details
Project type
Large-Scale EMSL Research
Start Date
2011-10-01
End Date
2013-09-30
Status
Closed
Released Data Link
Team
Principal Investigator
Co-Investigator(s)
Team Members