Skip to main content

Physics of Radiation Exposure and Characterization for Future Electronic Materials: Complex Oxides


EMSL Project ID
48061

Abstract

The objective of the project is to study radiation damage on complex oxides. Complex oxides, especially having perovskite-like structure with chemical formula ABO3 (‘A’ and ‘B’ are two cations of very different sizes) exhibit outstanding material functions including ferroelectricity, piezoelectricity, built-in spontaneous polarization and high dielectric constants. These oxides have been widely used in various applications such as piezoelectric transducers in nuclear reactors, and host phases for the immobilization of actinide and fission-product wastes. Recent studies on the charged ferroic domain walls have attracted much interest on the energy storage applications and the ferroelectric field-effect transistors, formed by the integration of polar and nonpolar semiconducting oxides through molecular beam epitaxy (MBE), is another on-going topic. By collaborating with EMSL’s ion accelerator systems and other characterization capabilities, the properties and performance of such oxides under ~MeV heavy-ion irradiation environment can be investigated. A thorough understanding of the impacts of ion processing will help control and further improve their functionalities. In conclusion, this project will result in a new materials design capability to enhance understanding of the interfacial ferroic domain-layer phenomena and the nature of energy materials, which strengthen the developments of EMSL’s Science Themes.

Project Details

Project type
Limited Scope
Start Date
2013-07-08
End Date
2013-09-07
Status
Closed

Team

Principal Investigator

Richard Osgood
Institution
Columbia University

Related Publications

Huang HC, L Zhang, G Malladi, JI Dadap, S Manandhar, K Kisslinger, VRS Vemuri, V Shutthanandan, H Bakhru, and R Osgood. 2015. "Radiation Damage By Light- And Heavy-Ion Bombardment of Single-Crystal LiNbO3." Optical Materials Express 5(5):1071-1088. doi:10. 1364/OME. 5. 001071